散射式扫描近场光学显微镜(s-SNOM) NeaSNOM
2015-02-02 15:15:24    点击:

型号:

NeaSNOM (Neaspec GmbH Co.)

基本信息:

NeaSNOM散射式近场光学显微镜是基于AFM系统的超高分辨光学显微成像系统。通过AFM探针针尖散射并收集样品的近场光学信号,获得纳米级分辨率(10 nm)的样品表面形貌和光场成像,分辨率与照明光源波长无关。

基本参数:

分辨率:10 nm

光源:可见光:633 nm波长激光;

中红外:9.3-10.8 µm可调谐波长激光

照明模式:反射式,透射式

扫描范围:x/y: 100 μm,精确度:0.4 nm

Z: 3 μm,精确度0.2 nm

样品尺寸要求:长宽<40 mm,高度<5 mm

 

Model:

NeaSNOM (Neaspec GmbH Company)

General Information:

The NeaSNOM scattering-type Scanning Near-field Optical Microscope is an innovative ultrahigh-resolution optical microscopy System, based on the Atomic Force Microscope (AFM) technology. NeaSNOM Systems rely on light scattering by the probing tip of an AFM with nanoscale dimensions, enabling near-field optical imaging at extreme sub-wavelength scale spatial resolution independent of the wavelength of light.

Basic Specifications:

Resolution: 10 nm

Near-Field Illumination source: Visible: 633 nm wavelength laser; Mid-IR: 9.3-10.8 µm step-tunable laser

x/y scanner range: 100 μm, resolution: 0.4 nm; Z scanner range: 3 μm, resolution: 0.2 nm

Sample requirement: lateral size < 40 mm, height < 5 mm